森安 宙さん（奥富・田中研）が IEEE CT East Joint Japan Chapter ICCE Young Scientist Paper Awardを受賞

論文題目：
"Top-K Confidence Map Aggregation for Robust Semantic Segmentation Against Unexpected Degradation"

著者：
Yu Moriyasu, Takashi Shibata, Masayuki Tanaka and Masatoshi Okutomi

賞：
IEEE CT East Joint Japan Chapter ICCE Young Scientist Paper Award

掲載誌：
Proceedings of IEEE 41st International Conference on Consumer Electronics (ICCE2023), pp.1-6, January 2023

DOI：
10.1109/ICCE56470.2023.10043389

受賞日：
2023年10月31日